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IEC 60749-2:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
12. 4. 2002.

Опште информације

60.60     12. 4. 2002.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V.
This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.

The contents of the corrigendum of August 2003 have been included in this copy.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

TRENUTNO

OBJAVLJEN
IEC 60749-2:2002 ED1
60.60 Standard objavljen
12. 4. 2002.

ISPRAVKE / IZMENE

OBJAVLJEN
IEC 60749-2:2002/COR1:2003 ED1