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IEC 60749-7:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
9. 4. 2002.

Опште информације

99.60     17. 6. 2011.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.

The contents of the corrigendum of August 2003 have been included in this copy.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

TRENUTNO

POVUČEN
IEC 60749-7:2002 ED1
99.60 Povlačenje stupilo na snagu
17. 6. 2011.

ISPRAVKE / IZMENE

POVUČEN
IEC 60749-7:2002/COR1:2003 ED1

REVIDIRAN OD

POVUČEN
IEC 60749-7:2011 ED2