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IEC 60749-11:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
12. 4. 2002.

Опште информације

60.60     12. 4. 2002.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

POVUČEN
IEC PAS 62185:2000 ED1

TRENUTNO

OBJAVLJEN
IEC 60749-11:2002 ED1
60.60 Standard objavljen
12. 4. 2002.

ISPRAVKE / IZMENE

OBJAVLJEN
IEC 60749-11:2002/COR1:2003 ED1

OBJAVLJEN
IEC 60749-11:2002/COR2:2003 ED1