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IEC 60749-12:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
30. 4. 2002.

Опште информације

99.60     13. 12. 2017.

WPUB   

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

POVUČEN
IEC PAS 62187:2000 ED1

TRENUTNO

POVUČEN
IEC 60749-12:2002 ED1
99.60 Povlačenje stupilo na snagu
13. 12. 2017.

ISPRAVKE / IZMENE

POVUČEN
IEC 60749-12:2002/COR1:2003 ED1

REVIDIRAN OD

OBJAVLJEN
IEC 60749-12:2017 ED2