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IEC 60747-14-12 ED1

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

Опште информације

50.20     28. 8. 2026.

PRVD    9. 10. 2026.

IEC

TC 47/SC 47E

Međunarodni standard

31.080.01  

Apstrakt

IEC 60747-14-12 ED1 specifies the performance test methods for CMOS imager-based gas sensors. It includes the terms and definitions, the test environmental conditions, the test system, the test methods, and the test report. This document is applicable to the performance test of both CMOS gas sensors based on lens-free imaging and CMOS gas sensors based on lens imaging.

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TRENUTNO

PROJEKAT
IEC 60747-14-12 ED1
50.20 Početak postupka odobravanja definitivnog teksta nacrta standarda
28. 8. 2026.

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