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Glavni meni

IEC 60749-36:2003 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state
13. 2. 2003.

Опште информације

60.60     13. 2. 2003.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

TRENUTNO

OBJAVLJEN
IEC 60749-36:2003 ED1
60.60 Standard objavljen
13. 2. 2003.