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Glavni meni

IEC 60749-24:2004 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
9. 3. 2004.

Опште информације

99.60     27. 11. 2025.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

POVUČEN
IEC PAS 62336:2002 ED1

TRENUTNO

POVUČEN
IEC 60749-24:2004 ED1
99.60 Povlačenje stupilo na snagu
27. 11. 2025.

REVIDIRAN OD

OBJAVLJEN
IEC 60749-24:2025 ED2