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IEC 60749-31:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
30. 8. 2002.

Опште информације

60.60     30. 8. 2002.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

The contents of the corrigendum of August 2003 have been included in this copy.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

TRENUTNO

OBJAVLJEN
IEC 60749-31:2002 ED1
60.60 Standard objavljen
30. 8. 2002.

ISPRAVKE / IZMENE

OBJAVLJEN
IEC 60749-31:2002/COR1:2003 ED1