IEC 62228-7:2026 ED2

Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers

Apstrakt

IEC 62228-7:2026 specifies test and measurement methods for the EMC evaluation of CXPI transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. This specification is applicable for standard CXPI transceiver ICs and ICs with embedded CXPI transceiver and covers:
- the emission of RF disturbances;
- the immunity against RF disturbances;
- the immunity against impulses;
- the immunity against electrostatic discharges (ESD).
This edition includes the following significant technical changes with respect to the previous edition:
a) change transceiver terms and definitions from master to commander and slave to responder in 3.1.5 and 3.1.6.
b) change test configuration for embedded transceiver in 5.3.1 and add on Figure A.4 accordingly.
c) change the definition of TX2 test signal for Type-B transceiver in 5.4.2.
d) add examples for test limits in Annex C.

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