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IEC 62276:2005 ED1

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
30. 5. 2005.

Опште информације

99.60     19. 10. 2012.

IEC

TC 49

Međunarodni standard

31.140  

engleski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

Provides specifications for manufacturing piezoelectric single crystal wafers to be used in surface acoustic wave devices. Applies to the manufacture of synthetic quartz, lithium niobate, lithium tantalate, lithium tetraborate, and lanthanum gallium silicate single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave filters and resonators.

Životni ciklus

PRETHODNO

POVUČEN
IEC PAS 62276:2001 ED1

TRENUTNO

POVUČEN
IEC 62276:2005 ED1
99.60 Povlačenje stupilo na snagu
19. 10. 2012.

REVIDIRAN OD

POVUČEN
IEC 62276:2012 ED2