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IEC 62276:2012 ED2

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
19. 10. 2012.

Опште информације

99.60     24. 10. 2016.

IEC

TC 49

Međunarodni standard

31.140  

engleski   francuski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition:
- terms and definitions are rearranged in accordance with the alphabetical order;
- "reduced LN" is appended to terms and definitions;
- "reduced LT" is appended to terms and definitions;
- reduction process is appended to terms and definitions.

Životni ciklus

PRETHODNO

POVUČEN
IEC 62276:2005 ED1

TRENUTNO

POVUČEN
IEC 62276:2012 ED2
99.60 Povlačenje stupilo na snagu
24. 10. 2016.

REVIDIRAN OD

POVUČEN
IEC 62276:2016 ED3