IEC 60115-4-10/FRAGF ED1

Fixed resistors for use in electronic equipment - Part 4-10: Blank detail specification: Power resistors with axial leads for through-hole assembly on circuit boards (THT), for general electronic equipment, classification level G

Apstrakt

IEC 60115-4-10:2023 is applicable to the drafting of detail specifications for fixed power resistors with leads, classified to level G, which is defined in IEC 60115‑1:2020, 3.4 for general electronic equipment. It is a supplementary document to the sectional specification and contains requirements for style, layout and minimum contents of detail specifications.
This first edition cancels and replaces IEC 60115-4-1:1983. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) it employs the product classification based on application requirements as defined in the generic specification IEC 60115-1:2020;
b) it permits the specification additional dimensional requirements concerning the eccentricity of termination wires and the coating extending onto wires;
c) it provides for a tabulated presentation of resistance ranges in relationship to the temperature coefficient and the tolerance;
d) it supports solderability testing for both, traditional lead-bearing soldering and up-to-date lead-free soldering, as required;
e) it introduces a test for the specimens’ robustness to electrostatic discharge if required;
f) it introduces a test for the specimens’ resistance to solvents if required;
g) it introduces a test for the flammability of the specimens if required;
h) it employs consistent stability requirements grouped in stability classes;
i) it supports the provision of detailed visual acceptance criteria
j) it includes the requirement for a visual inspection of the primary and proximity packaging;
k) it provides the correlated test schedules for a qualification approval and for subsequent quality conformance inspections side by side;
l) it employs quality assessment procedures which meet the requirements of a zero-defect approach, which evades the use of historic AQL levels and the permission of non-conforming specimens in test groups;
m) it provides for the inclusion of specific visual acceptance criteria, to be applied in addition to those given in Annex B of the sectional specification IEC 60115-4:2022;
n) furthermore, it employs a new document structure, for which a transition guidance is provided in Annex X.