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IEC 60749-26:2006 ED2

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
18. 7. 2006.

Опште информације

99.60     23. 4. 2013.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski  

Kupovina

Revidiran

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Apstrakt

Establishes a standard procedure for testing and classifying
semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749-26:2003 ED1

TRENUTNO

POVUČEN
IEC 60749-26:2006 ED2
99.60 Povlačenje stupilo na snagu
23. 4. 2013.

REVIDIRAN OD

POVUČEN
IEC 60749-26:2013 ED3