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IEC 60444-6:2013 ED2

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
19. 6. 2013.

Опште информације

99.60     1. 9. 2021.

WPUB   

IEC

TC 49

Međunarodni standard

31.140  

engleski   francuski  

Kupovina

Revidiran

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Apstrakt

IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60444-6:1995 ED1

TRENUTNO

POVUČEN
IEC 60444-6:2013 ED2
99.60 Povlačenje stupilo na snagu
1. 9. 2021.

REVIDIRAN OD

OBJAVLJEN
IEC 60444-6:2021 ED3