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IEC TR 62878-2-2:2015 ED1

Device embedded substrate - Part 2-2: Guidelines - Electrical testing
4. 12. 2015.

Опште информације

60.60     4. 12. 2015.

IEC

TC 91

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31.180     31.190  

engleski   francuski  

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Apstrakt

IEC TR 62878-2-2:2015 describes the necessary information on electrical testing for device embedded substrate. This includes the interconnection open- and short-circuit tests as well as the device functional test. It also provides guidelines by demonstrating the electrical test for device embedded substrate.

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OBJAVLJEN
IEC TR 62878-2-2:2015 ED1
60.60 Standard objavljen
4. 12. 2015.