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IEC 63202-1:2019 ED1

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
20. 6. 2019.

Опште информације

60.60     20. 6. 2019.

IEC

TC 82

Međunarodni standard

27.160  

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Apstrakt

IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 63202-1:2019 ED1
60.60 Standard objavljen
20. 6. 2019.

Nacionalna preuzimanja

SRPS EN IEC 63202-1:2020  
ISS

Fotonaponske ćelije-Deo 1: Merenje degradacije kristalnih silicijumskih fotonaponskih ćelija pri inicijalnom osvetljavanju

60.60   Standard objavljen

N082 Saznaj više