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Glavni meni

IEC 62047-21:2014 ED1

Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
19. 6. 2014.

Опште информације

60.60     19. 6. 2014.

IEC

TC 47/SC 47F

Međunarodni standard

31.080.99  

engleski   francuski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

IEC 62047-21:2014 specifies the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin-film micro-electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 µm.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 62047-21:2014 ED1
60.60 Standard objavljen
19. 6. 2014.