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IEC 62878-1-1:2015 ED1

Device embedded substrate - Part 1-1: Generic specification - Test methods
20. 5. 2015.

Опште информације

60.60     20. 5. 2015.

IEC

TC 91

Međunarodni standard

31.180     31.190  

engleski   francuski  

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Apstrakt

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 62878-1-1:2015 ED1
60.60 Standard objavljen
20. 5. 2015.