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IEC 60749-42:2014 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
12. 8. 2014.

Опште информације

60.60     12. 8. 2014.

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski  

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Objavljen

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Apstrakt

IEC 60749-42:2014 provides a test method to evaluate the endurance of semiconductor devices used in high temperature and high humidity environments. This test method is used to evaluate the endurance against corrosion of the metallic interconnection of chips of semiconductor devices contained in plastic moulded and other types of packages. It is also used as a means of accelerating the leakage phenomena due to the moisture penetration through the passivation film and as a pre-conditioning for various kinds of tests.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 60749-42:2014 ED1
60.60 Standard objavljen
12. 8. 2014.