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IEC 61338-1-5:2015 ED1

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
25. 6. 2015.

Опште информације

60.60     25. 6. 2015.

IEC

TC 49

Međunarodni standard

31.140  

engleski   francuski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition:
a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction;
b) changes to normative references;
c)addition to bibliography.

Životni ciklus

PRETHODNO

POVUČEN
IEC PAS 61338-1-5:2010 ED1

TRENUTNO

OBJAVLJEN
IEC 61338-1-5:2015 ED1
60.60 Standard objavljen
25. 6. 2015.