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IEC 62951-3:2018 ED1

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
7. 11. 2018.

Опште информације

60.60     7. 11. 2018.

IEC

TC 47

Međunarodni standard

31.080.99  

engleski  

Kupovina

Objavljen

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Apstrakt

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.

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TRENUTNO

OBJAVLJEN
IEC 62951-3:2018 ED1
60.60 Standard objavljen
7. 11. 2018.