Objavljen
IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.
OBJAVLJEN
IEC 60747-18-1:2019 ED1
60.60
Standard objavljen
20. 5. 2019.