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IEC TS 62607-9-1:2021 ED1

Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy
14. 10. 2021.

Опште информације

60.60     14. 10. 2021.

IEC

TC 113

Tehnička specifikacija

07.120  

engleski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured reference materials.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC TS 62607-9-1:2021 ED1
60.60 Standard objavljen
14. 10. 2021.