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Glavni meni

IEC 60748-11-1:1992 ED1

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
1. 4. 1992.

Опште информације

60.60     15. 5. 1992.

IEC

TC 47/SC 47A

Međunarodni standard

31.200  

engleski   francuski   ruski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC 60748-11-1:1992 ED1
60.60 Standard objavljen
15. 5. 1992.

REVIDIRAN OD

NAPUŠTEN
IEC 60748-11-1 ED2