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ISO 22493:2008

Microbeam analysis — Scanning electron microscopy — Vocabulary
19. 9. 2008.
95.99   Povučen   9. 4. 2014.

Опште информације

95.99     9. 4. 2014.

ISO

ISO/TC 202/SC 1

Međunarodni standard

37.020     01.040.37  

engleski   francuski  

Kupovina

Povučen

Jezik na kome želite da primite dokument.

Apstrakt

ISO 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
The vocabulary is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of the vocabulary are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

Životni ciklus

TRENUTNO

POVUČEN
ISO 22493:2008
95.99 Povučen
9. 4. 2014.

REVIDIRAN OD

OBJAVLJEN
ISO 22493:2014