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ISO 11938:2012

Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
6. 3. 2012.

Опште информације

90.93     5. 12. 2022.

ISO

ISO/TC 202/SC 2

Međunarodni standard

71.040.50  

engleski   francuski  

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Jezik na kome želite da primite dokument.

Apstrakt

This International Standard provides procedures for electron microprobe elemental-mapping analysis using
wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally
across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is
assessed. It describes five types of data processing: the raw X‑ray intensity data method, the k‑value method,
the calibration method, the correlation method and the matrix correction method.

Životni ciklus

TRENUTNO

OBJAVLJEN
ISO 11938:2012
90.93 Odluka o potvrđivanju standarda
5. 12. 2022.