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ISO 13084:2011

Surface chemical analysis — Secondary-ion mass spectrometry — Calibration of the mass scale for a time-of-flight secondary-ion mass spectrometer
5. 5. 2011.
95.99   Povučen   15. 11. 2018.

Опште информације

95.99     15. 11. 2018.

ISO

ISO/TC 201/SC 6

Međunarodni standard

71.040.40  

engleski  

Kupovina

Povučen

Jezik na kome želite da primite dokument.

Apstrakt

ISO 13084:2011 specifies a method to optimize the mass calibration accuracy in time-of-flight SIMS instruments used for general analytical purposes. It is only applicable to time-of-flight instruments but is not restricted to any particular instrument design. Guidance is provided for some of the instrumental parameters that can be optimized using this procedure and the types of generic peaks suitable to calibrate the mass scale for optimum mass accuracy.

Životni ciklus

TRENUTNO

POVUČEN
ISO 13084:2011
95.99 Povučen
15. 11. 2018.

REVIDIRAN OD

POVUČEN
ISO 13084:2018