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Glavni meni

ISO 15932:2013

Microbeam analysis — Analytical electron microscopy — Vocabulary
13. 12. 2013.

Опште информације

90.60     4. 6. 2024.

ISO

ISO/TC 202/SC 1

Međunarodni standard

37.020     01.040.37  

engleski   francuski  

Kupovina

Objavljen

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Apstrakt

ISO 15932:2013 defines terms used in the practice of AEM. It covers both general and specific concepts classified according to their hierarchy in a systematic order. It is applicable to all standardization documents relevant to the practice of AEM. In addition, some parts of this International Standard are applicable to those documents relevant to the practice of related fields (e.g. TEM, STEM, SEM, EPMA, EDX) for the definition of those terms common to them.

Životni ciklus

TRENUTNO

OBJAVLJEN
ISO 15932:2013
90.60 Završetak postupka preispitivanja standarda
4. 6. 2024.