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ISO 14594:2014

Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
21. 10. 2014.
95.99   Povučen   7. 6. 2024.

Опште информације

95.99     7. 6. 2024.

ISO

ISO/TC 202/SC 2

Međunarodni standard

71.040.50  

engleski  

Kupovina

Povučen

Jezik na kome želite da primite dokument.

Apstrakt

ISO 14594:2014 gives the general guidelines for the determination of experimental parameters relating to the primary beam, the wavelength spectrometer, and the sample that need to be taken into account when carrying out electron probe microanalysis. It also defines procedures for the determination of beam current, current density, dead time, wavelength resolution, background, analysis area, analysis depth, and analysis volume.
It is intended for the analysis of a well-polished sample using normal beam incidence, and the parameters obtained can only be indicative for other experimental conditions.
It is not designed to be used for energy dispersive X-ray spectroscopy.

Životni ciklus

PRETHODNO

POVUČEN
ISO 14594:2003

POVUČEN
ISO 14594:2003/Cor 1:2009

TRENUTNO

POVUČEN
ISO 14594:2014
95.99 Povučen
7. 6. 2024.

REVIDIRAN OD

OBJAVLJEN
ISO 14594:2024