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Glavni meni

ISO 17915:2018

Optics and photonics — Measurement method of semiconductor lasers for sensing
25. 5. 2018.

Опште информације

90.93     27. 9. 2023.

ISO

ISO/TC 172/SC 9

Međunarodni standard

31.260  

engleski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

Životni ciklus

PRETHODNO

POVUČEN
ISO/TS 17915:2013

TRENUTNO

OBJAVLJEN
ISO 17915:2018
90.93 Odluka o potvrđivanju standarda
27. 9. 2023.