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ISO 18118:2024

Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
28. 2. 2024.

Опште информације

60.60     28. 2. 2024.

ISO

ISO/TC 201/SC 7

Međunarodni standard

71.040.40  

engleski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

This document gives guidance on the measurement and use of experimentally-determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The methods described only apply to polycrystalline and amorphous materials, as effects inherent to single-crystal samples are not addressed.

Životni ciklus

PRETHODNO

POVUČEN
ISO 18118:2015

TRENUTNO

OBJAVLJEN
ISO 18118:2024
60.60 Standard objavljen
28. 2. 2024.