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ISO/WD 13139

Microbeam analysis — Analytical electron microscopy — The measurement of the dislocation density in thin metals

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20.60     5. 12. 2024.

ISO

ISO/TC 202/SC 3

Međunarodni standard

Apstrakt

This document specifies procedures for the measurement of dislocation density in thin metals by using transmission electron microscope. This document applies to measure the dislocation density lower than 11015m-2. This document applies to analyse the dislocations in a single grain of the thin metals’ specimen with the thickness between tens to hundreds of nanometers.

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TRENUTNO

PROJEKAT
ISO/WD 13139
20.60 Završetak rada na prednacrtu standarda
5. 12. 2024.