Telefon: (011) 7541-421, 3409-301, 3409-335, 6547-293, 3409-310
E-mail: Prodaja standarda: prodaja@iss.rs Seminari, obuke: iss-edukacija@iss.rs Informacije o standardima: infocentar@iss.rs
Stevana Brakusa 2, 11030 Beograd
Glavni meni

ISO/FDIS 32543-2

Non-destructive testing — Characteristics of focal spots in industrial X-ray systems — Part 2: Edge method with hole or disk type test objects

Опште информације

50.20     29. 9. 2025.

ISO

ISO/TC 135/SC 5

Međunarodni standard

19.100  

Apstrakt

This European standard specifies a method for the measurement of effective focal spot dimensions above 0,1 µm of X-ray systems by means of the edge method applied to digital images taken from hole type or disk type gauges. The imaging quality and the resolution of X-ray images depend highly on the characteristics of the effective focal spot, in particular the size and the two-dimensional intensity distribution as seen from the detector plane.
This document provides instructions for determining the effective size (dimensions) of standard, mini and micro focal spots of industrial X-ray tubes for users in applications where the pin hole method of EN12543-2 is not practicable. This determination is based on the measurement of a profile of an image of a hole or disk type gauge.
The method as described in this document can be used for long term monitoring of focal spot sizes without a pin hole camera.
The accuracy of this method is lower than the one of ISO 32543-1 (EN 12543-2), ISO/NP 32543-3 (EN 12543-5) and ISO/NP 32543-4 (future EN 12543-6), using ASTM hole plate IQIs (ASTM E 1025, E 1742), due to its manufacturer tolerance of 10%.

Životni ciklus

TRENUTNO

PROJEKAT
ISO/FDIS 32543-2
50.20 Početak postupka odobravanja definitivnog teksta nacrta standarda
29. 9. 2025.

Nacionalna preuzimanja

Ispitivanje bez razaranja — Karakteristike fokusnih tačaka u industrijskim rendgenskim sistemima — Deo 4: Metoda ivice sa meračem tipa rupe

50.20   Početak postupka odobravanja definitivnog teksta nacrta standarda

Pregled

Da biste videli ceo sadržaj, morate se registrovati ili prijaviti pomoću korisničkog imena koje već imate.

Prijavite se