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ISO/PWI 26545

Artificial Intelligence, machine learning algorithms and workflows in particle characterization

Опште информације

00.00     3. 10. 2025.

ISO

ISO/TC 24/SC 4

Međunarodni standard

Apstrakt

This document provides illustrative examples of frameworks, algorithms, and workflows for the application of Artificial Intelligence (AI) and Machine Learning (ML) in particle characterization techniques, including, but not limited to, laser diffraction, dynamic light scattering, and image analysis.

Životni ciklus

TRENUTNO

PROJEKAT
ISO/PWI 26545
00.00 Podnet predlog novog projekta
3. 10. 2025.