00.00 28. 7. 2026.
ISO
ISO/TC 172/SC 3
Međunarodni standard
This document specifies the measurement method used for calculating the temperature coefficient of the refractive index of infrared material substrates with measurements at different temperatures. The scope includes estimation of error factors and determination of required measurement equipment.
The intended temperature range for the specified measurement method is –40 °C to +80 °C. The intended wavelength range for the specified measurement method is 0,78 μm to 25 μm.
PROJEKAT
ISO/PWI 26978
00.00
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28. 7. 2026.