dnaSRPS EN IEC 60794-1-218:2025

Kablovi sa optičkim vlaknima — Deo 1-218: Generička specifikacija — Osnovni postupci ispitivanja optičkih kablova — Metode ispitivanja uticaja okoline — Ispitivanje optičkih jedinica izloženih cikličnim promenama temperature u srednjem opsegu, metoda F18

Optical fibre cables - Part 1-218: Generic specification - Basic optical cable test procedures - Environmental test methods - Mid-span temperature cycling test for exposed optical units, Method F18

Apstrakt

IEC 60794-1-218:2025 defines test procedures to establish uniform requirements for the environmental performance of:

- optical fibre cables for telecommunication equipment and devices employing similar techniques, and

- cables having a combination of both optical fibres and electrical conductors.

Throughout this document, the wording "optical cable" can also include optical fibre units, microduct fibre units, etc.

This document defines a test standard to determine the ability of optical cable elements from a cable exposed in a mid-span entry (expressed) and stored in a pedestal, closure or similar to withstand the effects of temperature cycling by observing changes in attenuation. The optical cable element bundles up single or multiple optical fibres, e.g. loose tube, tight buffer tube, or optical fibre ribbon.

See IEC 60794-1-2 for a reference guide to test methods of all types and for general requirements and definitions.

This first edition partially cancels and replaces the second edition of IEC 60794-1-22 published in 2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to IEC 60794‑1‑22:2017:

a) extension of the test method scope to apply to any optical cables with optical cable elements including loose tubes, tight buffer tubes, and ribbons, exposed in a mid-span entry (expressed) and stored in a pedestal, closure, or similar;

b) modification of the test method title according to item a);

c) deletion of the tube diameter requirement for the test object;

d) modification of the default temperature range according to IEC 60794-1-1;

e) addition of the default coiled turns in the assembly during the test.