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Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 5: Ultrasonic devices
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 6: Visual imaging devices
40.20 DIS ballot initiated: 12 weeks
Switching device for islanding (SDFI)
50.60 Close of voting. Proof returned by secretariat
Fully flexible organic light emitting diode (OLED) panels for general lighting - Performance requirements
50.20 Proof sent to secretariat or FDIS ballot initiated: 8 weeks
Concentric lay overhead electrical stranded conductors
40.20 DIS ballot initiated: 12 weeks
Germicidal equipment - Excimer sources - Safety
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 1: Transmittance evaluation method of EUV pellicle
40.60 Close of voting
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 3: Nano-scale wafer surface inspection method using UV light
40.20 DIS ballot initiated: 12 weeks
Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 4: Evaluation methods for dimensional accuracy of laser dicing process
40.60 Close of voting
High-level test description table for development of production test programs
40.60 Close of voting
Evaluation methods for protection against risk of fire in electric tumble dryers
10.99 New project approved
Atmospheric and altitude correction
20.99 WD approved for registration as CD
Measuring equipment for electrical and electromagnetic quantities - Environmental aspects
50.60 Close of voting. Proof returned by secretariat