Projekti
Pretražite srpske, evropske i međunarodne standarde. Odredite organizaciju koja je donosilac standarda, izaberite oznaku standarda ili ključnu reč i završite željenu pretragu. Možete dodati i fazu u izradi standarda ili komitet/komisiju koja je izradila standard.
Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
60.60
Standard objavljen
Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 1: General
60.60
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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
60.60
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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
60.60
Standard objavljen
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity)
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
60.60
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Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
60.60
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Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
60.60
Standard objavljen
