Projekti

Automatic electrical controls – Part 2-24: Particular requirements for displacement electrical controls

60.00   Standard u postupku objavljivanja

Automatic electrical controls -Part 2-25: Particular requirements for current sensing controls

40.60   Završetak javne rasprave

Automatic electrical controls – Part 2-26 Particular requirements for Wireless Power Transfer Controls (WPTCs)

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Automatic electrical controls for household and similar use - Part 2-3: Particular requirements for thermal protectors for ballasts for tubular fluorescent lamps

40.20   Nacrt na javnoj raspravi 60 dana

Automatic electrical controls - Part 2-9: Particular requirements for temperature sensing controls

60.00   Standard u postupku objavljivanja

Medical electrical equipment - Dosimeters with ionization chambers or solid-state detectors as used in radiotherapy

40.20   Nacrt na javnoj raspravi 60 dana

Amendment 1 - Household electrical appliances - Performance - Water for testing

40.20   Nacrt na javnoj raspravi 60 dana

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-1: Blank detail specification - Current limiting application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-2: Blank detail specification - Heating element application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-3: Blank detail specification - Inrush current application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-4: Blank detail specification - Sensing application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

50.00   Evidentiranje podataka o definitivnom tekstu nacrta standarda

Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

30.60   Završetak izjašnjavanja o nacrtu komisije standarda

Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

50.20   Početak postupka odobravanja definitivnog teksta nacrta standarda

Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes

50.99   Definitivni tekst nacrta standarda odobren za objavljivanje

Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

30.99   Nacrt komisije standarda odobrava se za javnu raspravu