Projekti

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-3: Blank detail specification - Inrush current application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Thermistors - Directly heated positive step-function temperature coefficient - Part 1-4: Blank detail specification - Sensing application - Assessment level EZ

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors

50.00   Evidentiranje podataka o definitivnom tekstu nacrta standarda

Semiconductor devices - Part 14-13: Semiconductor sensors - Performance test methods for spectral sensors

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation

30.60   Završetak izjašnjavanja o nacrtu komisije standarda

Semiconductor devices - Part 5-17: Optoelectronic devices - Light emitting diode - Measuring methods of optoelectronic parameters of micro scale light emitting diode array

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

50.20   Početak postupka odobravanja definitivnog teksta nacrta standarda

Semiconductor devices - Part 5-19: Optoelectronic devices - Light emitting diodes - Test method of the micro photoluminescence for chip wafers of micro light emitting diodes

50.99   Definitivni tekst nacrta standarda odobren za objavljivanje

Amendment 1 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

30.99   Nacrt komisije standarda odobrava se za javnu raspravu

Amendment 2 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Amendment 1 - Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

40.60   Završetak javne rasprave

Standard test procedures for semiconductor X-ray energy spectrometers

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 1: General requirements

40.20   Nacrt na javnoj raspravi 60 dana

Radiation protection instrumentation - Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 2: Specific requirements for radioactive aerosol monitors including transuranic aerosols

60.00   Standard u postupku objavljivanja

Nuclear facilities - Electrical equipment important to safety - Qualification

40.20   Nacrt na javnoj raspravi 60 dana

Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry

20.99   Prednacrt standarda prihvata se kao nacrt standarda

Optical fibres - Part 1-21: Measurement methods and test procedures - Coating geometry

20.99   Prednacrt standarda prihvata se kao nacrt standarda