Projekti

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 6: Procedure for identifying and evaluating defects using a combined method of optical inspection, photoluminescence and X-ray topography

10.20   Početak izjašnjavanja o predlogu

Semiconductor devices - Performance evaluation of semiconductor components and inspection equipment- Part 5: Evaluation methods for composition uniformity in laser dicing process

10.20   Početak izjašnjavanja o predlogu

Integrated Circuits - Standard roadmap for chiplet ICs

00.00   Podnet predlog novog projekta

integrated circuits – Three Dimensional Integrated Circuits Part x: In-line thermal measurement of warpage

00.00   Podnet predlog novog projekta

Integrated circuits – Part X: Standardization Roadmap for Fan-Out Packages

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IEC60191-6-23 Ed.1.0 :Standardization roadmap for fan-out packages

00.99   Predlog novog projekta se prihvata

IEC 6xxxxx-2: Required Specifications of package substrates for advanced semiconductor packaging - Part 2 Failure Analysis Methods for Current Induced Quality Test of Package Substrates

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IEC 6xxxxx-3: Required Specifications of package substrates for advanced semiconductor packaging - Part 3 Standard Substrates structure for Current Induced Quality Test of Package Substrates

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Test method of sound variation detection sensors for fire detection

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Semiconductor devices - Part 20: Machine-Interpretable Data Sheet for Power Semiconductors: Requirements for Data Format and Data Access for Power Electronic Design Tools

10.60   Završetak izjašnjavanja o predlogu

Semiconductor devices - Part 14-15: Semiconductor sensors - Performance test method of dynamic vision sensors

10.60   Završetak izjašnjavanja o predlogu

Semiconductor sensors - Measurement method for microchannel integrated resonant mass sensors in surface adsorption mode

10.20   Početak izjašnjavanja o predlogu

CONNECTORS FOR ELECTRONIC EQUIPMENT PRODUCT REQUIREMENTS Part 8-10X: Power connectors – Detail specification for 2-pole snap locking power rectangular connectors with plastic housing for rated current of 63 A

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Inductors - Near Magnetic and Electric Field Characterization

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Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 17: Balun-cores

10.60   Završetak izjašnjavanja o predlogu

<em>Standardized Data Format for Mission Profiles</em>

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Role-based Access Control – Definition of roles and permissions for engineering

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Part 90-33: Use of IEC 61850 for the Data Centers domain

00.99   Predlog novog projekta se prihvata