Projekti

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 6: Procedure for identifying and evaluating defects using a combined method of optical inspection, photoluminescence and X-ray topography

10.60   Završetak izjašnjavanja o predlogu

Semiconductor devices - Performance evaluation of semiconductor components and inspection equipment- Part 5: Evaluation methods for composition uniformity in laser dicing process

10.20   Početak izjašnjavanja o predlogu

Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 2: Nano-scale wafer surface inspection method using white light interferometry

10.20   Početak izjašnjavanja o predlogu

Semiconductor devices – Neuromorphic devices- Part 7: Evaluation method of synaptic decay time in memristor devices

10.20   Početak izjašnjavanja o predlogu

Integrated Circuits - Standard roadmap for chiplet ICs

00.00   Podnet predlog novog projekta

integrated circuits – Three Dimensional Integrated Circuits Part x: In-line thermal measurement of warpage

00.00   Podnet predlog novog projekta

Integrated circuits – Part X: Standardization Roadmap for Fan-Out Packages

00.00   Podnet predlog novog projekta

IEC60191-6-23 Ed.1.0 :Standardization roadmap for fan-out packages

00.99   Predlog novog projekta se prihvata

IEC 6xxxxx-2: Required Specifications of package substrates for advanced semiconductor packaging - Part 2 Failure Analysis Methods for Current Induced Quality Test of Package Substrates

00.00   Podnet predlog novog projekta

IEC 6xxxxx-3: Required Specifications of package substrates for advanced semiconductor packaging - Part 3 Standard Substrates structure for Current Induced Quality Test of Package Substrates

00.00   Podnet predlog novog projekta

Test method of sound variation detection sensors for fire detection

00.99   Predlog novog projekta se prihvata

Semiconductor devices - Part 20: Machine-Interpretable Data Sheet for Power Semiconductors: Requirements for Data Format and Data Access for Power Electronic Design Tools

10.60   Završetak izjašnjavanja o predlogu

Semiconductor devices - Part 14-15: Semiconductor sensors - Performance test method of dynamic vision sensors

10.60   Završetak izjašnjavanja o predlogu

Semiconductor sensors - Measurement method for microchannel integrated resonant mass sensors in surface adsorption mode

10.60   Završetak izjašnjavanja o predlogu

Semiconductor devices - Test method of pH sensors for metabolic status assessment of cultured cells

10.20   Početak izjašnjavanja o predlogu

Semiconductor devices - Micro-electromechanical devices - Part 66: Test method for processing electrophysiological impedance data obtained from 3D cell-tissue models in MEMS chip array-based high-throughput screening systems

10.20   Početak izjašnjavanja o predlogu

Semiconductor devices - Micro-electromechanical devices - Part 67: Microfluidic device for droplet-based 3D cell cultivation

10.20   Početak izjašnjavanja o predlogu

Semiconductor devices – Micro-electromechanical devices – Part 68: Test methods for magnetostriction coefficient of MEMS magnetic thin films

10.20   Početak izjašnjavanja o predlogu