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Glavni meni

IEC TR 63133:2017 ED1

Semiconductor devices - Scan based ageing level estimation for semiconductor devices
11. 10. 2017.

Опште информације

60.60     11. 10. 2017.

IEC

TC 47

Tehnički izveštaj

31.080.01  

engleski  

Kupovina

Objavljen

Jezik na kome želite da primite dokument.

Apstrakt

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

Životni ciklus

TRENUTNO

OBJAVLJEN
IEC TR 63133:2017 ED1
60.60 Standard objavljen
11. 10. 2017.