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IEC 63185:2020 ED1

Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method
8. 12. 2020.

Опште информације

99.60     19. 3. 2025.

IEC

TC 46/SC 46F

Međunarodni standard

33.120.30  

engleski   francuski   španski  

Kupovina

Revidiran

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Apstrakt

IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis.

Životni ciklus

TRENUTNO

POVUČEN
IEC 63185:2020 ED1
99.60 Povlačenje stupilo na snagu
19. 3. 2025.

REVIDIRAN OD

OBJAVLJEN
IEC 63185:2025 ED2

Nacionalna preuzimanja

SRPS EN IEC 63185:2021  
ISS

Merenje kompleksne permitivnosti dielektričkih supstrata sa malim gubicima primenom metode sa kružnim disk-rezonatorom

60.60   Standard objavljen

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