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IEC 62899-503-3:2021 ED1

Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
24. 8. 2021.

Опште информације

60.60     24. 8. 2021.

IEC

TC 119

Međunarodni standard

29.045     31.080.30  

engleski  

Kupovina

Objavljen

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Apstrakt

IEC 62899-503-3:2021(E) specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.

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OBJAVLJEN
IEC 62899-503-3:2021 ED1
60.60 Standard objavljen
24. 8. 2021.