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IEC PAS 62162:2000 ED1

Field-induced charged-device model test method for electrostatic discharge withstand thresholds of microelectronic components
22. 8. 2000.
95.99   Povučen   3. 5. 2017.

Опште информације

95.99     3. 5. 2017.

IEC

TC 47

Javno dostupna specifikacija

31.080.01  

engleski  

Kupovina

Zamenjen

Jezik na kome želite da primite dokument.

Apstrakt

Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.

Životni ciklus

TRENUTNO

POVUČEN
IEC PAS 62162:2000 ED1
95.99 Povučen
3. 5. 2017.

REVIDIRAN OD

POVUČEN
IEC 60749-28:2017 ED1