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IEC PAS 62177:2000 ED1

Highly-accelerated temperature and humidity stress test (HAST)
24. 8. 2000.
95.99   Povučen   1. 7. 2002.

Опште информације

95.99     1. 7. 2002.

IEC

TC 47

Javno dostupna specifikacija

31.080.01  

engleski  

Kupovina

Zamenjen

Jezik na kome želite da primite dokument.

Apstrakt

The highly-accelerated temperature and humidity stress test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Životni ciklus

TRENUTNO

POVUČEN
IEC PAS 62177:2000 ED1
95.99 Povučen
1. 7. 2002.

REVIDIRAN OD

POVUČEN
IEC 60749-4:2002 ED1