IEC 60749-4:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Datum objavljivanja: 12. 4. 2002.

Опште информације

Trenutna faza: 99.60 Effective date: 3. 3. 2017.

Sledeća faza: WPUB

Inicijator: IEC

Pripada: TC 47

Vrsta: Međunarodni standard

ICS: 31.080.01

Jezik: engleski francuski španski

Kupovina

Status: Revidiran

PDF

Papir

PDF i papir

Jezik

Jezik na kome želite da primite dokument.

Apstrakt

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

The contents of the corrigendum of August 2003 have been included in this copy.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

POVUČEN
IEC PAS 62177:2000 ED1

TRENUTNO

POVUČEN
IEC 60749-4:2002 ED1
99.60 Povlačenje stupilo na snagu
3. 3. 2017.

ISPRAVKE / IZMENE

POVUČEN
IEC 60749-4:2002/COR1:2003 ED1

REVIDIRAN OD

OBJAVLJEN
IEC 60749-4:2017 ED2