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IEC 60749-18:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
13. 12. 2002.

Опште информације

99.60     10. 4. 2019.

WPUB   

IEC

TC 47

Međunarodni standard

31.080.01  

engleski   francuski   španski  

Kupovina

Revidiran

Jezik na kome želite da primite dokument.

Apstrakt

Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source.
Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects.
It is intended for military- and space-related applications.

Životni ciklus

TRENUTNO

POVUČEN
IEC 60749-18:2002 ED1
99.60 Povlačenje stupilo na snagu
10. 4. 2019.

REVIDIRAN OD

OBJAVLJEN
IEC 60749-18:2019 ED2