IEC 60749-10:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Datum objavljivanja: 9. 4. 2002.

Опште информације

Trenutna faza: 99.60 Effective date: 27. 4. 2022.

Inicijator: IEC

Pripada: TC 47

Vrsta: Međunarodni standard

ICS: 31.080.01

Jezik: engleski francuski španski

Kupovina

Status: Revidiran

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Apstrakt

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.

The contents of the corrigendum of August 2003 have been included in this copy.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

POVUČEN
IEC PAS 62186:2000 ED1

TRENUTNO

POVUČEN
IEC 60749-10:2002 ED1
99.60 Povlačenje stupilo na snagu
27. 4. 2022.

ISPRAVKE / IZMENE

POVUČEN
IEC 60749-10:2002/COR1:2003 ED1

REVIDIRAN OD

OBJAVLJEN
IEC 60749-10:2022 ED2