IEC 60749-13:2002 ED1

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Datum objavljivanja: 12. 4. 2002.

Опште информације

Trenutna faza: 99.60 Effective date: 15. 2. 2018.

Sledeća faza: WPUB

Inicijator: IEC

Pripada: TC 47

Vrsta: Međunarodni standard

ICS: 31.080.01

Jezik: engleski francuski španski

Kupovina

Status: Revidiran

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Apstrakt

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Životni ciklus

PRETHODNO

POVUČEN
IEC 60749:1996 ED2

POVUČEN
IEC 60749:1996/AMD1:2000 ED2

POVUČEN
IEC 60749:1996/AMD2:2001 ED2

POVUČEN
IEC PAS 62183:2000 ED1

TRENUTNO

POVUČEN
IEC 60749-13:2002 ED1
99.60 Povlačenje stupilo na snagu
15. 2. 2018.

ISPRAVKE / IZMENE

POVUČEN
IEC 60749-13:2002/COR1:2003 ED1

REVIDIRAN OD

OBJAVLJEN
IEC 60749-13:2018 ED2